UNIQUE SCALABLE SOC TEST SOLUTION

Ultra compact, multi site, wafer and final test, 10GBit data transfer rate, smallest ATE module form factor, VHDL programming …

UNIQUE SCALABLE SOC TEST SOLUTION
UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

Digital/analog/mixed signal, VHDL device library, guided Probe back-tracking, QSM-VI signature analysis, automatic fault simulation, circuit tracer …

UNIQUE HIGH POWER TEST SOLUTION

UNIQUE HIGH POWER TEST SOLUTION

High speed test, compact, modular, multi site, wafer and final test, 5000 V and 1000 A ...

ACCESSORIES PRODUCTS

Unique PXI instruments, 19" VISM modules, 2D high end image processing for Zero Defect industrial applications

ACCESSORIES PRODUCTS

News & Highlights

  • Pressemitteilung

    Im Zeichen von Komponenten-Allocation und schwieriger Liefersituation aus Japan:
    Die Wareneingangsprüfung wird wieder sehr wichtig als Instrument
    von Qualitätssicherung und Kostensenkung

Testimonials
Testimonials

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Citation


Our target is to increase market for our high power discrete ATE platform. In addition to increase sales and our market shares for standard products. ATEip provides the right solution in networking, sales background and experience in the semiconductor business.

Johann Degenhart , Managing Director VXInstruments VXInstruments

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